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Handheld LIBS

 

Z-300 LIBS Analyzer Every Element in the Periodic Table, in Seconds,
in a Handheld

 

Z-300 выполняет то, что не делал ни один другой портативный анализатор. Это ручной анализатор, который измеряет каждый элемент в периодической таблице элементов — от H до U. Z-300 использует тот же лазер, что и Z-200, но с расширенным спектрометрическим диапазоном от 190 нм до 950 нм. Расширенный диапазон позволяет измерять эмиссионные линии от элементов H, F, N, O, Br, Cl, Rb, Cs и S. Эти линии не могут быть измерены с Z-200. Z-300 также измеряет более чувствительную линию для лития, чтобы достичь пределов обнаружения в диапазоне 2-5 частей на миллион. Z-300 также измеряет чувствительность и отсутствие помех для калия (K).

 

Более традиционные линии калия имеют сильные железные помехи, тогда как линия, используемая Z-300, свободна от таких помех. Z наиболее широко используется для разведки полезных ископаемых, в том числе лития как в скальных породах, так и в рассолах. Он также используется в областях судебной экспертизы, аутентификации, археологии, разведки нефти и газа из-за широкого спектра элементов. Как и в случае с Z-200, режим лазерного удара, чистка снимков, настройки спектрометра находятся под контролем пользователя. Анализатор включает в себя передовое программное обеспечение для изменения всех настроек, сравнения спектральных данных и для генерации количественных калибровочных кривых. Z-300 оснащен той же ОС Android и интуитивно понятным программным обеспечением, что и все другие модели SciAps.

Z-Series

Измеряет каждый элемент Периодической таблицы от H to U

Атомный уровень

Характеристики

Detector

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Display

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Weight

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Calibration

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Calibration Check

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Security

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Regulatory

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Power

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Dimensions

20mm 2 silicon drift detector (active area), 135eV resolution FWHM at 5.95Mn K-alpha line.

Анализируемые элементы

Application
Beam 1 (40 kV)
Beam 2 (10 kV)
Beam 3 (50 kV)
Geo-Mining
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U
Mg, Al, Si, P, S, K, Ca
Ag, Sn, Sb, Ba
Geo-Mining
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U
Mg, Al, Si, P, S, K, Ca
Ag, Sn, Sb, Ba
Geo-Mining
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U
Mg, Al, Si, P, S, K, Ca
Ag, Sn, Sb, Ba
Geo-Mining
Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, As, Se, Sr, Rb, Zr, Nb, Mo, W, Ta, Au, Hg, Pb, Bi, U
Mg, Al, Si, P, S, K, Ca
Ag, Sn, Sb, Ba

Bulk Samples and Microanalysis

The Z is the world’s only handheld offering elemental microanalysis in the field. Users may set up the raster to a grid pattern, utilizing the pinpoint 100 um laser spot size for elemental heat mapping point-by-point. For bulk samples, the Z can be set to average results from every raster location for a bulk sample result, just like handheld XRF analysis.


*Australian Synchrotron’s x-ray fluorescence microprobe (XFM) data courtesy of Shaun Barker (University of Waikato) and Jeremy Vaughan (Barrick).
heat-map1

An X-ray fluorescence map (XFM) for Fe. SciAps handheld LIBS now allows targeted microanalysis of geological samples in the field.

heat-map2

The corresponding LIBS element distribution map for Fe shows excellent correlation with the XFM map.

The 3 “Must Have’s” for Handheld LIBS

1

Argon Purge

The Z is the ONLY handheld LIBS with an integrated, user-replaceable argon purge. Operating in an argon environment yields 10x or more boost in signal, particularly for emissions in the deep UV (190 nm 0 300 nm), where many elements are measured. Shown in the figure are two spectra from a stainless steel, with and without argon, demonstrating the large signal boost. Also available are larger belt-mounted canisters (4x the volume). Users may also connect the Z to industry standard stationary argon tanks with our optional package of bridge regulator and tubing.

Stainless Steel 316 with and without Argon Purge ChartCan I use the Z-300 without argon? Yes. All our LIBS units can be run with/without argon or with/without spectrometer gating. You’ll need to use our ProfileBuilder App to adjust the calibration curves however.

Argon-Door-animation
2

Cleaning Mode Laser Technology

The Z features novel cleaning mode to provide automated, user-settable surface preparation depending on the type of application. Cleaning mode fires 5-6 mJ/pulse laser shots at 50 Hz (50 shots/second) thus 5 cleaning shots every 0.1 sec. Users can choose the number of total cleaning shots, after which the Z will use subsequent shots for spectral data and analysis. For metal surfaces which may be dirty or contaminated, the standard setting is for 10 cleaning shots, whereas for soil samples, often only a few are used. The cleaning shot capability may also be used for depth profiling, for example, monitoring elemental concentrations as functions of depth into the sample. The laser focus is also under software control so that analysis continues into the depth of the material.

Z300PagePlot-6061Ca_time
3

Rastered 2D Laser + Variable Focus

A large body of publications suggests the best LIBS precision is obtained when the laser is rastered, and results averaged over multiple locations. The Z takes rastering a step further for handhelds. It has an integrated XY stage, plus a Z-direction focus adjustment. In addition to factory-set rastering for specific applications (alloy, geochemical, etc.), the user may also setup their own raster pattern. A user can do a line scan, or even single spot analysis on an inclusion or vein of material. The laser spot size is approximately 50 um in diameter. The Z includes an illumination fiber which when aligned with the rastering, illuminates the location where the plasma will is created. With the software-controlled variable focus, a user can obtain analytical results as a function of sample thickness.

raster-pattern